}?>
By Joining you agree to MachPrinciple's Terms and Conditions and Privacy Policy
Click to Login
Please check your email. A registration confirmation link will be sent to your mailbox..
A registration confirmation link has been sent to your email. Please check your email and finish the registration process.
Search a Conference through our dedicated search page
This course will teach theory and practice for high-accuracy correlative light and electron microscopy. Students will learn high-accuracy CLEM on resin embedded samples using SEM approaches (Peddie et al. 2014) as well as using TEM according to the procedures developed in the Briggs group at EMBL (Kukulski et al. 2011). The course will also cover the extension of this approach to cryo-EM specimens (Schorb and Briggs 2014), and more recently developed equipment and work flows for cryo-CLEM.